Medical imaging plays a crucial role in the diagnosis and treatment of various diseases, such as cardiovascular issues and cancer. X-ray imaging is widely used in the medical field due to its effectiveness in providing detailed images of the internal structures of the body. The development of advanced X-ray detectors is essential to improve imaging quality, reduce radiation doses, and enhance diagnostic capabilities.
Traditional X-ray detectors made of semiconductor materials have shown limitations in terms of X-ray absorption efficiency and high costs. While direct-conversion detectors offer superior resolution and lower radiation doses compared to indirect-conversion detectors made of scintillator materials, the existing semiconductor materials like Si, a-Se, and CdZnTe/CdTe have drawbacks that hinder their widespread use in X-ray imaging applications.
Perovskite has emerged as a promising alternative to conventional semiconductor materials due to its high X-ray absorption efficiency and cost-effectiveness. In a recent study by researchers at the Shenzhen Institutes of Advanced Technology (SIAT), a high-performance perovskite X-ray complementary metal-oxide-semiconductor (CMOS) detector was developed in collaboration with Central China Normal University. This breakthrough offers new possibilities for revolutionizing X-ray detection technology.
The direct-conversion X-ray detector fabricated with a thick CsPbBr3 perovskite film printed on a dedicated CMOS pixel array demonstrated impressive results. The perovskite CMOS detector showed a high X-ray detection sensitivity, low dose detection limit, and excellent spatial resolution in 2D imaging. Additionally, the detector was able to perform 3D CT imaging at a fast signal readout speed, highlighting its potential for widespread application in medical imaging.
The successful integration of perovskite materials with high-speed pixelated CMOS arrays opens up new possibilities for the development of state-of-the-art X-ray detectors. Prof. Ge, the lead researcher on the project, emphasized the revolutionary impact of lead halide perovskites in enhancing spatial resolution, readout speed, and low-dose detection efficiency in X-ray imaging. This research paves the way for future advancements in medical imaging technology.
The innovative use of perovskite materials in combination with CMOS technology represents a significant milestone in the field of X-ray detection. The development of high-performance perovskite CMOS detectors holds great promise for improving medical imaging capabilities, ultimately benefiting patients and healthcare providers alike. By addressing the limitations of traditional semiconductor materials, this research opens up a new era of enhanced X-ray imaging technology.